By J. L. de Vries (auth.), John V. Gilfrich, Ron Jenkins, Robert L. Snyder, Mary Ann Zaitz, I. Cev Noyan, Ting C. Huang, Deane K. Smith, Paul K. Predecki (eds.)
Historical stories of X-Ray technology and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry; J.L. de Vries.Conditoningof X-Ray Beams and different advancements in X-Ray Instrumentation: program of Graded Multilayer Optics in X-Ray Diffraction; M.Schuster, H. Gobel.Stress and pressure decision through DiffractionMethods, top Broadening Analysis: real projects of rigidity research through Diffraction; V. Hauk.Characterization of Polymers, AmorphousMaterials and Organics through X-Ray Neutron Scattering: research of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers; N.S. Murthy.Precision, Accuracy in XRD, section Analysis: result of X-Ray Powder Diffraction around Robin exams with Corundum Plates and Powder Samples; V. Valvoda, et al.Characterization of skinny motion pictures byX-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in skinny movies; I.C. Noyan, C.C. Goldsmith.Other functions of X-RayDiffractions together with High-Temperature and Nonambient: TotalReflection XRF and hint research: Quantitative ZRF DataInterpretation and different XRF Applications. ninety five extra Articles. Index.
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Additional resources for Advances in X-Ray Analysis: Volume 39
While many new and novel ideas have come from instrument users over the years, it has invariably been left to the instrument developers to bring the ideas to reality. Not always were the decisions over instrument specification based on careful consideration and scientific reasoning. Tbere is a now-famous story that is told about the traditional radius of the powder diffiactometer goniometer circle. 3 cm for the goniometer radius ofhis now-famous wide range goniometer. Several theories had been suggested over the years as to why 17 cm would be an optimum number.
Improving d-spacing derivation by profile fitting and full pattern analysis of the digitized trace were early goals. Obtaining intensity information from peak decomposition for quantitative applications and crystal structure analysis also became important in the later 1980s. The number of computer pro grams was increasing rapidly. This time frame also saw the initiation of the conversion to mini computers and personal computers, so much effort was spent on converting existing programs to these new platforms.
G. Barkla found emission line series; he named them K, L, etc. 1912 M. von Laue, W. Friedrich. P. L. H. J. D. Coolidge introduced the hot-filament, high-vacuum x-ray tube 1913-1923 M. Siegbahn did his classic work of measuring wavelengths of x-ray spectra of the chemical elements 1922 A. Hadding first applied x-ray spectra specifically to chemical analysis (of minerals) 1923 D. Coster and G. von Hevesy discovered hafnium, the first element to be identified by its x-ray spectrum 1923 G. von Hevesy proposed quantitative analysis by secondary excitation of x-ray spectra 1923 R.
Advances in X-Ray Analysis: Volume 39 by J. L. de Vries (auth.), John V. Gilfrich, Ron Jenkins, Robert L. Snyder, Mary Ann Zaitz, I. Cev Noyan, Ting C. Huang, Deane K. Smith, Paul K. Predecki (eds.)